IEEE C62.11-1987 pdf free

04-28-2021 comment

IEEE C62.11-1987 pdf free.IEEE Standard for Metal-Oxide SurgeArresters for AC Power Circuits.
IEEE C62.11 The voltagewithstand tests of arrester insulation demon-strate that the insulation of the arrester is abovethe minimum specified level.See 8.1. Power-Frequency Sparkover Tests. Thistest applies only to gapped arrester designs thatutilize grading currents of less than 1.0 A tocause power-frequency sparkover. It demon-strates that the power-frequency sparkover ofthe arrester is greater than the arrester MCovrating by a specified margin.See 8.2.Discharge-Current Withstand Tests. Thedischarge-current withstand tests,consisting ofhigh current,short-duration and lowcurrent,long-duration tests, serve to demonstrate the adequacy of the electrical,mechanical,and thermal design of the arrester. See 8.6.
Discharge-Voltage Tests. Discharge-volt-age tests serve to establish the relation betweenthe voltage across the arrester terminals anddischarge current at several values of dischargecurrent of specified wave shape. They also showthe relation between discharge voltage andarrester rating so that the discharge-voltagecharacteristics of high-voltage arresters may bedetermined by extrapolation. See 8.3.Impulse Protective Level ‘Tests. The im-pulse protective level test is applicable only toarrester designs that undergo a sparkover modeand serves to demonstrate whether the protec-tive margin is defined by the arrester’s sparkover voltage or its discharge voltage for aspecified waveshape. See 8.4.
Internal-Ionization Voltage Test. The in-ternal-ionization voltage test provides a measureof ionization current present within an arresterdesign. This may cause deterioration of internalarrester parts.See 8.8.
Pressure-Relief/Fault-Current with-stand Tests.The pressure-relief/ fault-currentwithstand tests serve to demonstrate that failedarresters will conduct fault current under specified conditions without violent disintegration.See 8.9 and 8.10.
Contamination Tests. The contaminationtests serve to demonstrate that the arrester willwithstand a prescribed power-frequency voltageunder prescribed surface contamination withoutflashover or thermal runaway.See 8.12.
Disconnector Tests.The disconnectortests serve to demonstrate that disconnectorscan withstand, without operation,the arresterdesign tests and provide a current-time char-acteristic operating curve.See 8.11.
Accelerated Aging Procedure.The accelerated aging procedure provides a method tosimulate the longterm effects of voltage andtemperature on design parameters significant tothe arrester performance.See 8.5.
All test specimens for arrester designsincorporating a disconnector,either as an inte-gral part or as an accessory,shall include thedisconnector.The arrester shall be mounted in theposition(s) in which it is designed to be used.The arrester mounting bracket, if used,shall be connected to the ground terminal.The grading or control ring, if used, shallbe included in design tests influenced by straycapacitance effects.IEEE C62.11 pdf download.

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