IEEE C57.13-1993 pdf free

05-18-2021 comment

IEEE C57.13-1993 pdf free.IEEE Standard Require ments for Instrument Trans for mers.
IEEE C57.13 A.n instnm ent tansfom er shall be assioned a basic im pu.le insulation level B Ⅱ) to indicate the factory dielectrictests thatthe tansform er is capable ofw ithstanding.
W tn the follow ‘ing exoeptions, basic im pule insulation volacges, applied voltacge test voltages forprim ary w indinginsulation , and creepage distances and wet tests foroutdoor instnm enttransform ers are listed in table 2 and table 3:
a)Applied voltage tests for prim ary w inding insulation are not requied on gounded-neutal tem inal typevoltage tansfom ers.
b) For insulated-neutal term inal type volage transfom ers, the applied voltace test for prim ary w inding insulation shallbe 19 kV on outdoortypes w ith B 亚s greater than 110 kv.on indoortypes, and on outdloortypesw ith BLsof110 kv or less, the testshallbe 10 kV .
c)There is no B 亚 requirem ent on the neutal term inalof gounded-neutalor insulated-neutral tem inaltypevoltage tansform ers.
d)The applied volacge test forsecondary w inding insulation and betv een m ultiple secondary w indings shallbe2.5 kV.
e) The applied volage test for autotansform ers foruse in the secondary circuits of instum ent tansfom ersshallbe 2.5 kV .
The applied voltage test for the prim ary insulation of auxiliary instnum ent transfom ers (for use in the secondary circuits of instnum enttansfom ers) shallbe 2.5 kV .
g)The applied volage testbetl een prim ary w indings of three-w ire tpe cument tansfom ers w ith 0 kVBL shallbe 4 kv.
The lim its ofobservable tem perature rie in instum enttransform ersw hen tested in accodance w ith their ratings shallbe as given in table 4, and the transform ers shallbe designed so that the hotest-spot w inding temn perature rise aboveam bientw illnotexaeed the vahues given in tabe 4.
These ae the routine, type, and other tests that are necessary to assure that the design and consmuction of thetransform er are adequate to m eet the specified requirem ents.The m ethod ofm aking tests shallbe as descrbed fnclause 8 , exoeptas otherw ise required in table 3,orby equivalentaltenate m ethods.
Each instnum ent transform er shall reaeive the follow ‘ing routine tests at the factory .T hee tests shallbe m ade on theinstnum ent tansform erafter oom plete asscm bly, w here feasible.IEEE C57.13 pdf download.

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