IEEE C37.41-2000 pdf free

05-18-2021 comment

IEEE C37.41-2000 pdf free.IEEE Standard Design Tests for High-Voltage Fuses,Distribution Enclosed Single-Pole Air Switches,Fuse Disconnecting Switches, andAccessories.
IEEE C37.41 For devices covered by this standard, all applicable tests need not be performed on each design modificationof a previous qualified design. To assure that overall performance has not been adversely affected as a resultof the design modification, sufficient tests shall be performed to ensure that the modified design will have aperformance that meets or exceeds the ratings and performance requirements of the standards specified inClause 3.For devices that have been assigned ratings or performance requirements that are different fromthe standards specified in Clause 3, the modified design shall have ratings and performance requirementsthat meet or exceed the values assigned to the original device.
Fuses connected in parallel shall be considered a separate design and be tested accordingly.
The design tests for FEPs are performed to determine the adequacy of a particular type of design, style, ormodel of equipment to meet its assigned ratings and for satisfactory operation. In general, a fuse need not betested if it has already been tested in an equivalent enclosure.
Testing parameters in this document and the specification documents for each device are listed as a valuewith an allowable plus tolerance, a value with an allowable minus tolerance, a minimum value, or a range.When a range is specified, the test may be performed anywhere within that range. When a minimum value ora value with a plus tolerance is specified, the manufacturer may perform the test at any value that equals orexceeds the minimum value. When a value with a minus tolerance is specified the manufacturer may per-form the test at any value that is equal to or less than the maximum value allowed. When a minimum valueor a tolerance is specified, testing by persons other than the manufacturer shall be at the specified value, orpermission to test at a different level shall be obtained from the manufacturer.IEEE C37.41 pdf download.

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