IEEE 112-1984 pdf free

04-27-2021 comment

IEEE 112-1984 pdf free. IEEE Standard Test Procedure for Polyphase Induction Motors and Generators.
IEEE 112 Polyphase induction ma-chines are normally given a routine test,butmay be given additional tests.
For typical routine tests refer to ANSI/NEMA MG1-1978[5],2 parts 12 and 20.A typical form for reporting routine testdata is shown in Section 8,Form A-1.Atypical form for reportingadditional testdata is shown in Section 8, Form A-2.Choice of Tests. A complete list of the testscovered by this standard is given in the Tableof Contents. Alternate methods are described for making many of the tests,suitable fordifferent sizes and types of machines and dif-ferent conditions. In some cases, the preferredmethod is indicated.
The schedule of factory and field tests whichmay be required on new equipment is normallyspecified by applicable standards or by contractspecifications.The manufacturer’s choice ofmethod for factory or field tests on newequipment will govern,in lieu of prior agree-ment or contract specification.Use of this Standard. After the methodof test is chosen,all necessary data may be ob-tained by following the instructions and pre-cautions given only in those subsections whichcontain,in their left-hand margins,the letterdesignating the method selected. For example:when testing by Method B,reference needbe made only to the paragraphs opposite theletter“B”or the word“All,” which will beemployed to designate subsections commonto all methods. Many of these subsections include alternate methods for obtaining thenecessary data.Unless otherwise specified, themanufacturer maychoose the method bestsuited to the facilities available in such cases.3.4 Precautions During Test.Since the performance of an induction machine is dependentnot only upon the value of voltage and frequency but also on the wave shape and thebalance in magnitude and phase angle of thevoltages,correct data can be obtained onlyby careful measurement and by employinga suitable source of power. (See 4.1.1.)
Rapid changes in frequencycannot be tolerated on input-output tests,assuch variations are transmitted to the output-measuring devices. Any departure from assumed frequency directly affects the efficiencyobtained by Methods A or B. For these meth-ods,the frequencyshall be measured (orknown to be) within 0.5% of the specified testvalue.
Instrument Selection. The instru-ments used in electrical measurements shall beselected to give indications well up on thescale,that is,where a fraction of a division iseasilyestimated and where such a fraction isa small percentage of the value read.4
Instrument ‘Transformers. When cur-rent and potential instrument transformersare used,corrections shall be made for ratioerrors in voltage and current measurementsand for ratio and phase-angle errors in powermeasurements.4
Voltage.The phase voltages shall beread at the motor terminals. Tests may bemade where the voltage unbalance does not ex-ceed ± 0.5%.The percent voltage unbalanceequals 100 times the maximum voltage devia-tion from the average voltage divided by theaverage voltage. IEEE 112 pdf download.

Download infomation Go to download
Note: Can you help me share this website on your Facebook or others? Many thanks!
IEEE N42.46-2008 pdf free Free IEEE Standards

IEEE N42.46-2008 pdf free

IEEE N42.46-2008 pdf free.American National Standard for Determination of the Imaging Performance of X-Ray and Gamma-Ray Systems for Cargo and Vehicle Security Screening. IEEE N42.46 is intended to be used to determine the imaging performance of x-ray...
Get More
IEEE P1906.1-D2.0-2014 pdf free Free IEEE Standards

IEEE P1906.1-D2.0-2014 pdf free

IEEE P1906.1-D2.0-2014 pdf free.Draft Recommended Practice for Nanoscale and Molecular Communication Framework. A common framework greatly aids in communicating ideas among researchers from diverse fields and developing useflul simulators for nanoLseale communication. This includes interconnecting systems of...
Get More
IEEE C37.20.3-2001 pdf free Free IEEE Standards

IEEE C37.20.3-2001 pdf free

IEEE C37.20.3-2001 pdf free.IEEE Standard for Metal-Enclosed Interrupter Switchgear. 3.5.2 design tests: Tests made by the manufacturer to determine the adequacy of the design of a particulartype, style, or model of equipment or its component parts to...
Get More

LEAVE A REPLY

Anonymous netizen Fill in information