IEEE C62.35-1987 pdf free.IEEE Standard Test Specifications for Avalanche Junction Semiconductor Surge Protective Devices.
IEEE C62.35 applies to a two terminal avalanche junction surge suppressor for surge protective application on systemswith dc to 420 Hz frequency and voltages equal to or less than 1000 V rms or 1200 V dc.The avalanche junction surgesuppressor is a semiconductor diode which can operate in either the forward or reverse direction of its v-Icharacteristic.The device is a single package which may be assembled from any combination of series andJor paralleldiode chips.This standard contains definitions, service conditions, and a series of test criteria for determining theelectrical characteristics of these semiconductor avalanche junction surge suppressors. If the characteristics differ withthe direction of conduction, then each direction of conduction shall be separately specified.’ Arresters are covered inANSI/IEEE C62.1-1984 [1]2.3 and ANSIIEEE C62.33-1982[2].
The tests in this standard are intended as design tests as defined in ANSI/IEEE Std 100-1988[4] and provide a meansof comparison among various avalanche junction surge-protective devices.
Semiconductor avalanche junction surge suppressors are a class of diodes that are designed to conduct the surgecurrents necessary to provide transient overvoltage protection in electrical circuits. Other types of diodes may exhibitsurge capability.Unless their surge characteristics have been defined according to this specification, they should not beused as surge suppressors. Avalanche junction surge suppressors exhibit a relatively high impedance at normal systemvoltages before and after the surge.They limit surge voltages on equipment by providing a low impedance to conduct the surge discharge current. More specifically, this standard applies to such devices having a monotonic increase involtage with increasing current flow.
Test criteria and definitions in this standard provide a common engineering language beneficial to user andmanufacturer of surge-protective devices.
Due to the voltage and energy levels employed in the majority of tests described herein all tests should be consideredhazardous and appropriate caution should be taken in their performance.IEEE C62.35 pdf download.