IEEE C37.20.4-2001 pdf free.IEEE Standard for lndoor AC Switches (1 kV-38 kV) for Use in Metal-Enclosed Switchgear.
The definitions of terms contained in this standard, or in other standards referred to in this standard,are not intended to embrace all legitimate meanings of the terms. They are applicable only to thesubject treated in this standard.
lf a term is not defined in this standard, the definition in IEEE Std C37.100-1992 applies.An asterisk(*) following a definition indicates that the definition in this standard is not contained in IEEE StdC37.100-1992 while a dagger () indicates that the definition differs from that in IEEE Std C37.100-1992.Some terms and definitions given in IEEE Std C37.100-1992 are repeated in this standard forclarity. Some definitions are copied from IEEE Std 1247-1998.
3.1 bypass switch: A non-load break switch used in parallel with another device such that closing thebypass switch will commutate current flow in the parallel device and allow it to be removed from thecircuit.Example: this switch is used in switchgear for bypass feeders and in transfer bus schemes.
3.2 conformance tests: Tests made to demonstrate compliance with the applicable standards. The testspecimen is normally subjected to all planned production tests prior to initiation of the conformancetest program. Reference ANSI C37.58-1990 applies.
NOTE—The conformance tests may, or may not, be similar to certain design tests. Demonstration of margin (capability) beyondthe standards is not required.
3.3 design tests: Tests made by the manufacturer to determine the adequacy of the design of aparticular type, style, or model of equipment or its component parts to meet its assigned ratings and tooperate satisfactorily under normal service conditions or under special conditions,if specified, andwhich may be used to demonstrate compliance with applicable industry standards.
l—Design tests are made on representative apparatus or prototypes to verify the design analysis and calculation methods and to
substantiate the ratings assigned to all other apparatus of basically the same design. These tests are not intended to be madeon every design variation or to be used as part of normal production.The applicable portion of these designs tests may alsobe used to evaluate modifications of a previous design and to ensure that performance has not been adversely affected. Thesedata from previous similar designs may also be used for current designs, where appropriate. Once made, the tests need not berepeated unless the design is changed so as to modify performance.
2—Design tests are sometimes called”type tests.”IEEE C37.20.4 pdf download.